学术会议-OIT'2017

发布时间:2017-05-05

    The 2017 International Conference on Optical Instrument and Technology (OIT’2017) is the sixth event cosponsored by SPIE and China Instrument and Control Society (CIS). OIT is a professional conference that primarily focuses on optical instruments and related technologies. The OIT’2017 expects to promote the continuous development of optoelectronic technology &instrumentation and to inject new energy to the new industrial revolution.
    OIT’2017 will highlight the key advancements of optoelectronic instrument and technology. The academic topics of the conference will focus on optical systems, optoelectronic instruments, optical sensors, imaging, optoelectronic measurement, optical communications and optical network/microwave photonics and their applications, laser and its applications, micro/nano manufacturing, measurements and metrology, THz technologies and its applications etc. OIT’2017 sponsors will provide an academically equal opportunity platform to communicate the newest interesting science or technology for all attendees, researchers and experts from all over the world. You are warmly welcome to participate in this event at Beijing, China. Your contribution to OIT’2017 is greatly appreciated.
All presentations (Oral or Poster) accepted by OIT’2017 conference will be edited and published by SPIE, proceedings of     OIT’2017, and will be provided information, including citations and abstracts, references, and full text as appropriate to engineering and scientific indexes and abstract databases, including Ei Compendex, S Web of Science Conference Proceedings Citation Index-Science, copus, lnspec, CrossRef, DeepDyve, Google Scholar, and others.



Abstract Due Date:
      15 July, 2017

Manuscript Due Date:
      15 September, 2017
 


 
 

Website: http://www.oe-oem.org/oit/